What is ATPG_Logic_Cluster? which application published by GÖPEL Electronic has a module or feature called ATPG_Logic_Cluster?

ATPG_Logic_Cluster stands for "Automatic Test Pattern Generation for Logic Clusters", which is a method used in the design and testing of integrated circuits to ensure the reliability and functionality of the circuit. This technique involves generating test patterns or signals that can be applied to the integrated circuit to detect and diagnose any faults or errors. The application published by GÖPEL Electronic that has a module or feature called ATPG_Logic_Cluster is their "Scanflex® Embedded Boundary Scan System". This system is a hardware and software combination that allows for testing and programming of complex electronic circuits with embedded boundary scan technology. The ATPG_Logic_Cluster feature in this system provides automatic test pattern generation for logic clusters, making it easier and more efficient to test complex integrated circuits.